Advanced, versatile semiconductor inspection and wafer management systems.
Manufacturing equipment from steppers to the most sophisticated inspection systems has given Nikon invaluable experience in the field of microelectronics. This experience has allowed Nikon to become a worldwide leader in microelectronics technology and in the manufacture of advanced instruments designed specifically for the production and inspection of semiconductors and flat panel displays.
Products
subcategories
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DART Software
Semiconductor wafer inspection software offering features such as image archiving, defect review, post probe review and online communications.
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Eclipse L200N Series
200mm wafer and mask inspection microscope systems for reflected light defect identification.
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Eclipse LV-DAF
An upright microscope with dynamic auto-focus that brings fast, versatile focus to the Eclipse LV semiconductor inspection microscope series and OEM applications.
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Eclipse LV150 Series
Modular reflected light microscope systems for wafer inspection and materials science applications.
Microelectronics, Metallurgy, Fabrics/Textiles, Composites, Metal Manufacturing, Automotive Manufacturing…
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NWL-860
IC inspection wafer loader capable of handling 8- and 6-inch (200 and 150 mm) wafers.
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Optistation-V
Compact wafer inspection solution featuring exceptional accuracy and high throughput at a modest price.
